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5. Quantitative Phase Imaging at the Nanoscale by Scanning X-ray Microscope Using Multilayer Laue lense

Quantitative Phase Imaging at the Nanoscale by Scanning X-ray Microscope Using Multilayer Laue lense

来源 :THE 11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (第十一次X | 被引量 : 0次 | 上传用户：cxxxcs

【出 处】

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THE 11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (第十一次X

【发表日期】

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2012年8期

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