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5. Learn on the fly technique combined with QM/MM approach:Defects in semiconductors at finite temperat

Learn on the fly technique combined with QM/MM approach:Defects in semiconductors at finite temperat

来源 :The International Conference on Theory and Applications of C | 被引量 : 0次 | 上传用户：mnm159753

【作 者】

：

Martina Miskufova 

【机 构】

：

Chemistry Department,University College London

【出 处】

：

The International Conference on Theory and Applications of C

【发表日期】

：

2008年1期

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