论文部分内容阅读
Deposition and Properties of Highly C-oriented of InN Films on Sapphire Substrates with ECR-plasma E
【机 构】
:
School of Physics and Optoelectronic Technology, Dalian University of Technology,Dalian 116024 China
【出 处】
:
2011年材料表面与界面国际大会
【发表日期】
:
2011年9期
其他文献
Comparative study on structural and optical properties of ZnO thin film prepared on Si(111) and GaN/
会议
Characteristics of three-dimensional asymmetric gradient joint with different interfaces processed b
Effect of CMT process on weldability and interfacial microstructure of joint between 5052 aluminum a
Study on polymer micro-fracture by in-situ small angle X-ray scattering and molecular dynamics simul
会议