Development of Dynamic and In-Situ Ellipsometry Based on Liquid Crystal Retarder

来源 :8th International Conference on Nanophotonics(2015年第八届国际纳米光子 | 被引量 : 0次 | 上传用户：double3A

【摘要】

：

　　The ellipsometry features mainly in characterizing optical properties of materials and providing non-contact and nondestructive measurements for a variety o

【作者】

：

Wen-Tse Shih Mei-Li Hsieh Yu Faye Chao

【机构】

：

Department of Opto-Electronic System Engineering, Minghsin University of Science and Technology, Hsi

【出处】

：

8th International Conference on Nanophotonics(2015年第八届国际纳米光子

【发表日期】

：

2015年期

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　　The ellipsometry features mainly in characterizing optical properties of materials and providing non-contact and nondestructive measurements for a variety of samples [1-4].

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Development of Dynamic and In-Situ Ellipsometry Based on Liquid Crystal Retarder

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