Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Micr - 论文文献免费下载 - 皮皮文库

Nano-scale Characterization of Nitrides using Helium Temperature Scanning Transmission Electron Micr

来源 :The 13th International Conference on Physics of Light-Matter | 被引量 : 0次 | 上传用户：myskyhoney

【作者】

：

【机构】

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InstituteofExperimentalPhysics,Otto-von-Guericke-UniversityMagdeburg,Germany

【出处】

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The 13th International Conference on Physics of Light-Matter

【发表日期】

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2012年6期

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