【摘 要】
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Solar cell manufacturers are constantly challenged to increase the device conversion efficiency.As a consequence,more and more stringent specifications are required regarding the electronic properties
【出 处】
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SNEC 第十届(2016)国际太阳能产业及光伏工程(上海)论坛
论文部分内容阅读
Solar cell manufacturers are constantly challenged to increase the device conversion efficiency.As a consequence,more and more stringent specifications are required regarding the electronic properties of the substrates,which are mostly Czochralski (Cz) Silicon wafers.Yet the wafer quality (i.e.the carrier lifetime) is not constant and can vary by orders of magnitude even within a given Cz ingot.Depending on their defect content,wafers can also show very different behaviors during high temperature steps of standard homojunction processes.In order to sustain the quest of higher efficiencies and to keep reasonable efficiency distributions,it is essential that the wafer quality be controlled.In this context,AET Solar Tech (France) and CEA (France) have jointly developed a tool called OxyMap,to help wafer and cell manufacturers better control the quality of outgoing/incoming wafers,and adapt the manufacturing processes accordingly.The talk will address the capabilities of the tool in technical details,and will focus on the characterization of oxygen-related defects and the detection of low-quality wafers,which are shown to be critical for the industry.
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