论文部分内容阅读
Orientation Effects in Ballistic High-Strained P-type Si Nanowire FETs
【机 构】
:
Key Laboratory of MEMS of Ministry of Education,Southeast University,Nanjing,Jiangsu,CHINA
【出 处】
:
中国微米纳米技术学会第十届学术年会暨第一届国际会议(1st International Conference of th
【发表日期】
:
2008年期
其他文献
The I-V characteristics and percolation threshold of the cement-based materials filled with multi-wa
会议
Metrology Method of Line Edge Roughness with Nanometer Scale Precision Using Atomic Force Microscope
会议