Critical current in polycrystalline YBa2Cu4O8 under pressure

来源 :第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna | 被引量 : 0次 | 上传用户：juzhaoyang

【摘要】

：

Poor transport critical current density,jc,is a limiting factor for future applications of polycrystalline high-Tc superconductors,where jc is strongly depressed by grain boundary weak links.

【作者】

：

Britt M. Andersson Bertil Sundqvist

【机构】

：

Department of Applied Physics and Electronics,Ume(a) University,Ume(a),SE-90187,Sweden

【出处】

：

第26届国际高压科学技术大会、第8届亚洲高压科技学术会议暨第19届中国高压科学技术会议(The 26th Interna

【发表日期】

：

2017年10期

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　　Poor transport critical current density,jc,is a limiting factor for future applications of polycrystalline high-Tc superconductors,where jc is strongly depressed by grain boundary weak links.

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