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Defects in m-plane ZnO epitaxial films grown on (112) LaAlO3 substrate
【机 构】
：
Department of Materials Science and Engineering,National Chiao Tung University,Hsinchu,Taiwan
【出 处】
：
第六届国际氧化锌及相关材料研讨会
【发表日期】
：
2010年4期
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