【摘 要】
：
介绍了中国计量科学研究院基于控制背景辐射的黑体发射率测量原理，方法和装置的研究进展.基于普朗克黑体辐射理论，建立了控制背景辐射的黑体发射率测量方法的理论模型，并且
【机 构】
：
中国计量科学研究院热工计量科学与材料特性测量技术研究所,北京100013
【出 处】
：
第十届全国激光技术与光电子学学术会议
论文部分内容阅读
介绍了中国计量科学研究院基于控制背景辐射的黑体发射率测量原理，方法和装置的研究进展.基于普朗克黑体辐射理论，建立了控制背景辐射的黑体发射率测量方法的理论模型，并且搭建该测量装置，研究了该方法测量黑体空腔发射率的结果和影响因素.通过建立的测量系统得到黑体空腔发射率测量的结果与理论模拟的结果高度吻合，测量重复性的标准偏差达到0.04％.
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