Multiferroic materials have been drawing extensive attention worldwide because they simultaneously possess ferroelectric,ferromagnetic,and/or ferroelastic properties.
Nowadays,AFMs are capable of simultaneously characterizing high resolution topography together with physical properties such as quantitative mechanical mapping,magnetic domain structure,resistance/con
In addition to resistors,capacitors and inductors,which are defined in terms of a linear relationship between charge q,current I,voltage v,and magnetic flux j(Fig.1),Chua proposed in 1971 a fourth lin