Grain Boundary Impurities in Nanostructured Aluminium:Advanced Atom Probe Characterisation

来源 :IUPAC 5th International Symposium on Novel Materials and the | 被引量 : 0次 | 上传用户：hellokitty420

【作者】

：

J.M.Cairney D.S.Gianola F.Tang

【机构】

：

Australian Key Centre for Microscopy and Microanalysis,University of Sydney,NSW,2006,Australia

【出处】

：

IUPAC 5th International Symposium on Novel Materials and the

【发表日期】

：

2009年12期

【关键词】

：

Nanocrystalline materials Atom probe tomography Grain boundary migration Impurit

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